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Volumn 205, Issue 1, 1998, Pages 287-293
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New Approach for Determination of the Critical Behavior of Conductivity near the Metal-Insulator Transition in Doped Semiconductors
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0032330830
PISSN: 03701972
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1521-3951(199801)205:1<287::AID-PSSB287>3.0.CO;2-C Document Type: Article |
Times cited : (6)
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References (14)
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