High-resolution x-ray spectrometer based on spherically bent crystals for investigations of femtosecond laser plasmas

Review of Scientific Instruments

Volumn 69, Issue 12, 1998, Pages 4049-4053

  Young, B K F ^a   Osterheld, A L ^a   Price, D F ^a   Shepherd, R ^a   Stewart, R E ^a   Faenov, A Ya ^b   Magunov, A I ^b   Pikuz, T A ^b   Skobelev, I Yu ^b   Flora, F ^c   Bollanti, S ^c   Di Lazzaro, P ^c   Letardi, T ^c   Grilli, A ^d   Palladino, L ^e   Reale, A ^e   Scafati, A ^f   Reale, L ^f  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b Multicharged Ions Spectra Data Center of VNIIFTRI   (Russian Federation)

^c ENEA   (Italy)

^d INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

^e UNIVERSITY OF L'AQUILA   (Italy)

^f ISTITUTO SUPERIORE DI SANITÀ   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALS; ELECTROMAGNETIC FIELDS; EMISSION SPECTROSCOPY; GEOMETRICAL OPTICS; LASER PRODUCED PLASMAS; LASER PULSES; MATHEMATICAL MODELS; ULTRAFAST PHENOMENA; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

HIGH LUMINOSITY; SPHERICALLY BENT CRYSTAL;

X RAY SPECTROMETERS;

EID: 0032324857     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149249     Document Type: Article

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