Characterization of nickel-copper multilayer and copper thin film using neutron reflectivity measurements

Applied Surface Science

Volumn 115, Issue 4, 1997, Pages 311-316

  Vedpathak, Mahesh ^a   Basu, Saibal ^b   Kulkarni, S K ^a  

^a UNIVERSITY OF PUNE   (India)

^b BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

Multilayer; Neutron; Reflectivity; Thin film

Indexed keywords

CHARACTERIZATION; COPPER; DIFFUSION; INTERFACES (MATERIALS); METALLIC GLASS; MULTILAYERS; NEUTRON REFLECTION; NEUTRON SCATTERING; NICKEL;

ELECTRON BEAM EVAPORATION; NEUTRON REFLECTIVITY MEASUREMENT;

THIN FILMS;

EID: 0031212889     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00162-1     Document Type: Article

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