-
1
-
-
0027699669
-
-
Ishitani, A., Lesaicherre, P., Kamiyama, S., Ando, K. and Watanabe, H., IEICE Trans. Electron., 1993, E76-C, 1564.
-
(1993)
IEICE Trans. Electron.
, vol.E76-C
, pp. 1564
-
-
Ishitani, A.1
Lesaicherre, P.2
Kamiyama, S.3
Ando, K.4
Watanabe, H.5
-
2
-
-
0027589847
-
-
Lo, G. O., Kwong, D. L., Fazan, P. C., Mathews, V. K. and Sandler, N., IEEE Electron Device Lett., 1993, 14, 216.
-
(1993)
IEEE Electron Device Lett.
, vol.14
, pp. 216
-
-
Lo, G.O.1
Kwong, D.L.2
Fazan, P.C.3
Mathews, V.K.4
Sandler, N.5
-
3
-
-
84954191552
-
-
Kamiyama, S., Saeki, T., Mori, H. and Numasawa, Y., IEDM Tech. Dig., 1991, 827.
-
(1991)
IEDM Tech. Dig.
, pp. 827
-
-
Kamiyama, S.1
Saeki, T.2
Mori, H.3
Numasawa, Y.4
-
4
-
-
84954092281
-
-
Koyama, K., Sakuma, T., Yamamichi, S., Watanabe, H., Aoki, H., Ohya, O., Miyasaka, Y. and Kikkawa, T., IEDM Tech. Dig., 1991, 823.
-
(1991)
IEDM Tech. Dig.
, pp. 823
-
-
Koyama, K.1
Sakuma, T.2
Yamamichi, S.3
Watanabe, H.4
Aoki, H.5
Ohya, O.6
Miyasaka, Y.7
Kikkawa, T.8
-
5
-
-
84913021958
-
-
Van Buskirk, P. C., Gardiner, R., Kirlin, P. S. and Krupanidhi, S., J. Vac. Sci. Technol., 1992, A10, 1578.
-
(1992)
J. Vac. Sci. Technol.
, vol.A10
, pp. 1578
-
-
Van Buskirk, P.C.1
Gardiner, R.2
Kirlin, P.S.3
Krupanidhi, S.4
-
6
-
-
36448998565
-
-
Joshi, P. C. and Krupanidhi, S. B., J. Appl. Phys., 1993, 73, 7627.
-
(1993)
J. Appl. Phys.
, vol.73
, pp. 7627
-
-
Joshi, P.C.1
Krupanidhi, S.B.2
-
7
-
-
0027259660
-
-
Aoki, H., Hashimoto, T., Ikawa, E., Kikkawa, T., Takeuchi, K., Yamamichi, S., Sakuma, T. and Miyasaka, Y., Jpn. J. Appl. Phys., 1993, 32, 376.
-
(1993)
Jpn. J. Appl. Phys.
, vol.32
, pp. 376
-
-
Aoki, H.1
Hashimoto, T.2
Ikawa, E.3
Kikkawa, T.4
Takeuchi, K.5
Yamamichi, S.6
Sakuma, T.7
Miyasaka, Y.8
-
8
-
-
0026918562
-
-
Saito, K., Choi, J. H. and Fukuda, T., Jpn. J. Appl. Phys., 1992, 31, L1260.
-
(1992)
Jpn. J. Appl. Phys.
, vol.31
-
-
Saito, K.1
Choi, J.H.2
Fukuda, T.3
-
9
-
-
0013455791
-
-
Itoh, H., Kashihara, K., Okudaira, T., Tsukamoto, K. and Akasaka, Y., IEDM Tech. Dig., 1991, 831.
-
(1991)
IEDM Tech. Dig.
, pp. 831
-
-
Itoh, H.1
Kashihara, K.2
Okudaira, T.3
Tsukamoto, K.4
Akasaka, Y.5
-
10
-
-
84954181788
-
-
Rajeevakumar, T. V., Lii, T., Weinberg, Z., Bronner, G. B., McFarland, P., Coane, P., Kwietniak, K., Megdanis, A., Stein, K. J. and Cohen, S., IEDM Tech. Dig., 1991, 835.
-
(1991)
IEDM Tech. Dig.
, pp. 835
-
-
Rajeevakumar, T.V.1
Lii, T.2
Weinberg, Z.3
Bronner, G.B.4
McFarland, P.5
Coane, P.6
Kwietniak, K.7
Megdanis, A.8
Stein, K.J.9
Cohen, S.10
-
12
-
-
0025505464
-
-
Kobayashi, M. and Hoshinouchi, S., Boshoku Gijutsu (Japanese), 1990, 39, 576.
-
(1990)
Boshoku Gijutsu (Japanese)
, vol.39
, pp. 576
-
-
Kobayashi, M.1
Hoshinouchi, S.2
-
15
-
-
0019565711
-
-
Harper, J. M. E., Cuomo, J. J., Leary, P. A., Summa, G. M., Kaufman, H. R. and Bresnock, F. J., J. Electrochem. Soc., 1981, 128, 1077.
-
(1981)
J. Electrochem. Soc.
, vol.128
, pp. 1077
-
-
Harper, J.M.E.1
Cuomo, J.J.2
Leary, P.A.3
Summa, G.M.4
Kaufman, H.R.5
Bresnock, F.J.6
-
19
-
-
0001588940
-
-
Comfort, J. H., Garverick, L. M. and Reif, R., J. Appl. Phys., 1987, 62, 3388.
-
(1987)
J. Appl. Phys.
, vol.62
, pp. 3388
-
-
Comfort, J.H.1
Garverick, L.M.2
Reif, R.3
-
20
-
-
0030283859
-
-
Kim, H. W. and Reif, R., Thin Solid Films, 1996, 289, 192.
-
(1996)
Thin Solid Films
, vol.289
, pp. 192
-
-
Kim, H.W.1
Reif, R.2
-
21
-
-
36549093561
-
-
Meyerson, B. S., LeGoues, F. K., Nguyen, T. N. and Harame, D. L., Appl. Phys. Lett., 1987, 50, 113.
-
(1987)
Appl. Phys. Lett.
, vol.50
, pp. 113
-
-
Meyerson, B.S.1
LeGoues, F.K.2
Nguyen, T.N.3
Harame, D.L.4
-
22
-
-
36449001354
-
-
Ohmi, T., Hashimoto, K., Morita, M. and Shibata, T., J. Appl. Phys., 1991, 69, 2062.
-
(1991)
J. Appl. Phys.
, vol.69
, pp. 2062
-
-
Ohmi, T.1
Hashimoto, K.2
Morita, M.3
Shibata, T.4
-
23
-
-
84955046144
-
-
Burke, R. R., Pelletier, J., Pomot, C. and Vallier, L., J. Vac. Sci. Technol., 1990, A8, 2931.
-
(1990)
J. Vac. Sci. Technol.
, vol.A8
, pp. 2931
-
-
Burke, R.R.1
Pelletier, J.2
Pomot, C.3
Vallier, L.4
-
24
-
-
0030234848
-
-
Kim, D. S. and Lee, Y. H., Thin Solid Films, 1996, 283, 109.
-
(1996)
Thin Solid Films
, vol.283
, pp. 109
-
-
Kim, D.S.1
Lee, Y.H.2
-
25
-
-
0346657724
-
-
Hayama, M., Murai, H. and Kobayashi, K., J. Appl. Phys., 1990, 67, 1356.
-
(1990)
J. Appl. Phys.
, vol.67
, pp. 1356
-
-
Hayama, M.1
Murai, H.2
Kobayashi, K.3
-
26
-
-
0026883243
-
-
Shin, H., Okamoto, K., Miyazaki, S. and Hirose, M., Jpn. J. Appl. Phys., 1992, 31, 1953.
-
(1992)
Jpn. J. Appl. Phys.
, vol.31
, pp. 1953
-
-
Shin, H.1
Okamoto, K.2
Miyazaki, S.3
Hirose, M.4
-
27
-
-
0001662216
-
-
Machida, K. and Oikawa, H., J. Vac. Sci. Technol., 1986, B4, 818.
-
(1986)
J. Vac. Sci. Technol.
, vol.B4
, pp. 818
-
-
Machida, K.1
Oikawa, H.2
-
28
-
-
0030261611
-
-
Endo, K., Tatsumi, T. and Matsubara, Y., Jpn. J. Appl. Phys., 1996, 35, L1348.
-
(1996)
Jpn. J. Appl. Phys.
, vol.35
-
-
Endo, K.1
Tatsumi, T.2
Matsubara, Y.3
-
29
-
-
0024640955
-
-
d'Heurle, F. M. and Harper, J. M. E., Thin Solid Films, 1989, 171, 81.
-
(1989)
Thin Solid Films
, vol.171
, pp. 81
-
-
D'Heurle, F.M.1
Harper, J.M.E.2
-
31
-
-
84967881234
-
-
Martinu, L., Klemberg-Sapieha, J. E., Kuettel, O. M., Raveh, A. and Wertheimer, M. R., J. Vac. Sci. Technol., 1994, A12, 1360.
-
(1994)
J. Vac. Sci. Technol.
, vol.A12
, pp. 1360
-
-
Martinu, L.1
Klemberg-Sapieha, J.E.2
Kuettel, O.M.3
Raveh, A.4
Wertheimer, M.R.5
-
32
-
-
21844516082
-
-
Lee, Y. H., Chan, K. K. and Brady, M. J., J. Vac. Sci. Technol., 1995, A13, 596.
-
(1995)
J. Vac. Sci. Technol.
, vol.A13
, pp. 596
-
-
Lee, Y.H.1
Chan, K.K.2
Brady, M.J.3
-
34
-
-
0027187188
-
-
Rausch, N. and Burte, E. P., J. Electrochem. Soc., 1993, 140, 145.
-
(1993)
J. Electrochem. Soc.
, vol.140
, pp. 145
-
-
Rausch, N.1
Burte, E.P.2
-
35
-
-
36449009495
-
-
Paranjape, D. V., Sastry, M. and Ganguly, P., Appl. Phys. Lett., 1993, 63, 18.
-
(1993)
Appl. Phys. Lett.
, vol.63
, pp. 18
-
-
Paranjape, D.V.1
Sastry, M.2
Ganguly, P.3
-
37
-
-
31644443243
-
-
Kamada, T., Kitakawa, M., Shibuya, M. and Hirao, T., Jpn. J. Appl. Phys., 1991, 30, 3594.
-
(1991)
Jpn. J. Appl. Phys.
, vol.30
, pp. 3594
-
-
Kamada, T.1
Kitakawa, M.2
Shibuya, M.3
Hirao, T.4
-
38
-
-
84957341287
-
-
Wicaksana, D., Kobayashi, A. and Kinbara, A., J. Vac. Sci. Technol., 1992, A10, 1479.
-
(1992)
J. Vac. Sci. Technol.
, vol.A10
, pp. 1479
-
-
Wicaksana, D.1
Kobayashi, A.2
Kinbara, A.3
-
39
-
-
0019227232
-
-
Fromhold, A. T. Jr. and Baker, J. M., J. Appl. Phys., 1980, 51, 6377.
-
(1980)
J. Appl. Phys.
, vol.51
, pp. 6377
-
-
Fromhold A.T., Jr.1
Baker, J.M.2
-
40
-
-
0346026642
-
-
Millot, F., Picard, C. and Berthon, J., High Temp. High Pressures, 1987, 19, 337.
-
(1987)
High Temp. High Pressures
, vol.19
, pp. 337
-
-
Millot, F.1
Picard, C.2
Berthon, J.3
-
41
-
-
77951743606
-
-
2
-
Maeda, M., Yamamura, T. and Ikeda, T., Jpn. J. Appl. Phys., 1987, 26(26-2), 76.
-
(1987)
Jpn. J. Appl. Phys.
, vol.26
, Issue.26
, pp. 76
-
-
Maeda, M.1
Yamamura, T.2
Ikeda, T.3
-
42
-
-
0029405659
-
-
Sasase, M., Miyake, K., Takano, I. and Isobe, S., Thin Solid Films, 1995, 269, 36.
-
(1995)
Thin Solid Films
, vol.269
, pp. 36
-
-
Sasase, M.1
Miyake, K.2
Takano, I.3
Isobe, S.4
-
44
-
-
0042002182
-
-
Leiberich, A., Maher, D., Knoell, R. and Brown, W. L., Nucl. Instr. and Meth., 1987, B19/20, 457.
-
(1987)
Nucl. Instr. and Meth.
, vol.B19-20
, pp. 457
-
-
Leiberich, A.1
Maher, D.2
Knoell, R.3
Brown, W.L.4
-
45
-
-
0026202277
-
-
Lyman, P. F., Thevuthasan, S. and Seiberling, L. E., J. Crystal Growth, 1991, 113, 45.
-
(1991)
J. Crystal Growth
, vol.113
, pp. 45
-
-
Lyman, P.F.1
Thevuthasan, S.2
Seiberling, L.E.3
-
46
-
-
0030565152
-
-
Saitoh, K., Niwa, H., Nakao, S., Miyagawa, Y. and Miyagawa, S., Nucl. Instr. and Meth., 1996, B118, 718.
-
(1996)
Nucl. Instr. and Meth.
, vol.B118
, pp. 718
-
-
Saitoh, K.1
Niwa, H.2
Nakao, S.3
Miyagawa, Y.4
Miyagawa, S.5
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