In-situ grazing incidence X-ray diffractometry of polycrystalline copper in alkaline chloride and sulphate electrolytes

Electrochimica Acta

Volumn 43, Issue 19-20, 1998, Pages 2979-2984

  Kautek, Wolfgang ^a   Mirwald, Stefan ^a,b   Sahre, Mario ^c   Nauer, Gerhard E ^c  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b SIEMENS AG   (Germany)

^c UNIVERSITY OF VIENNA   (Austria)

Author keywords

Copper; Corrosion; In situ grazing incidence X ray diffractometry; X ray diffractometry

Indexed keywords

CHLORINE COMPOUNDS; COPPER; CORROSION; ELECTROLYTES; OXIDATION; PH EFFECTS; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; REDUCTION; SULFUR COMPOUNDS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ELECTROCHEMICAL OXIDATION; ELECTROCHEMICAL REDUCTION; IN SITU GRAZING INCIDENCE;

ELECTROCHEMISTRY;

EID: 0032316066     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(98)00038-3     Document Type: Article

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