A simple approach to seu cross section evaluation

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2884-2890

  Miroshkin, V V ^a   Tverskoy, M G ^a  

^a PETERSBURG NUCLEAR PHYSICS INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

NEUTRON IRRADIATION; PROTON IRRADIATION; SEMICONDUCTOR MATERIALS;

SINGLE EVENT UPSETS (SEU);

RADIATION EFFECTS;

EID: 0032313890     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736543     Document Type: Article

References (7)

1. E.P.Petersen, "Approaches to Proton Single Event Rate Calculations" IEEE Transactions on Nuclear Science, vol. 43, pp. 496-504, April 1996.
2. V.V.Miroshkin, M.G.Tverskoy, "Two Parameter Model for Predicting SEU Rate" IEEE Transactions on Nuclear Science, vol. 41, pp. 2085-2092, December 1994.
3. V.V.Miroskin, M.G.Tverskoy, "Some Aspects of Application of the Two-Parameter SEU Model" IEEE Transaction on Nuclear Science, vol. 42, pp. 1809-1814, December 1995.
4. R.Harboe-S0rensen, "Proton SEE Results - A Summary of ESA's Ground Test Data" 1997 RADECS Conference Data Workshop Record, 1997, pp. 89-96.
5. D.K.Nichols, W.E.Price, J.L.Andrews, "The Dependence of Single Event Upset on Proton Energy (15-590 MeV) " IEEE Transaction on Nuclear Science, vol. 29, pp. 20812084, December 1982.
6. M.Ohlsson, P.Dyreklev, KJohansson, P.Alfke, "Neutron Single Event Upsets in SRAM-Based FPGAs" to be published in 1998 IEEE Radiation Effects Data Workshop Record.
7. L.V.Bakanov, K.N.Ermakov, V.D.Lebedev, V.V.Pashuk, V.V.Miroshkin, M.V.Stabnikov, M.G.Tverskoy, "Proton + 40Ar Reaction Cross Section at 1 GeV" J.Phys G: Nucl. Phys., vol. 9, pp. L43-L46, 1983.