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Volumn 29, Issue 6, 1982, Pages 2081-2084
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The dependence of single event upset on proton energy (15-590 MeV)
a a b |
Author keywords
[No Author keywords available]
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Indexed keywords
DATA STORAGE, DIGITAL - RANDOM ACCESS;
PROTONS;
RADIATION EFFECTS;
SATELLITES;
DATA STORAGE, SEMICONDUCTOR;
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EID: 0020271813
PISSN: 00189499
EISSN: 15581578
Source Type: Journal
DOI: 10.1109/TNS.1982.4336500 Document Type: Article |
Times cited : (24)
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References (9)
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