Temperature control of a handler test interface

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 114-118

  Pfahnl, Andreas C ^a   Lienhard V, John H ^b   Slocum, Alexander H ^b  

^a 33 Constitution Drive   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE UNDER TEST (DUT); ELECTRIC RESISTANCE HEATERS; TEST CONTACTORS;

ELECTRIC RESISTANCE; HIGH TEMPERATURE APPLICATIONS; TEMPERATURE CONTROL; THERMAL CONDUCTIVITY OF SOLIDS;

INTEGRATED CIRCUIT TESTING;

EID: 0032311813     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743144     Document Type: Conference Paper

References (6)

1. Attaran, M., "Automated Test of RF Components," in Conference Proceedings RF Expo West, 1995, pp. 235-237.
2. Brandes, J. J., "High-Performance Production Test Contactors for Fine-Pitch Integrated Circuits," in International Test Conference 1997 Proceedings, 1997, pp. 518-526.
3. "Handlers/Sorters Reference. In Search of the Perfect Interface," Evaluation Engineering, vol. 27, no. 5, 1988, pp. 48-58.
4. Riechelmann, R., "Contactors for Testing at High Frequencies," International Test Conference 1988 Proceedings, 1988, pp. 500-501.
5. Scheiber, S.F., "Getting More Out of Handlers," Test & Measurement World, vol. 8, no. 5, 1988, pp. 99-104.
6. Tustaniwskyj, J. I. and Babcock, J. W., "Constant Temperature Control of a Device Under Test (DUT) - Part 1," in Advances in Electronic Packaging 1997 Volume 2, ASME, New York, NY, 1997, pp. 2031-2036.