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Volumn 45, Issue 6 PART 1, 1998, Pages 2689-2694
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Electrical performance and radiation sensitivity of stacked PMOS dosimeters under bulkbias control
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
MOSFET DEVICES;
RADIATION HARDENING;
VOLTAGE CONTROL;
BULKBIAS CONTROL;
STACKED PMOS DOSIMETERS;
DOSIMETERS;
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EID: 0032311599
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: 10.1109/23.736516 Document Type: Article |
Times cited : (25)
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References (10)
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