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Volumn 45, Issue 6 PART 1, 1998, Pages 2689-2694

Electrical performance and radiation sensitivity of stacked PMOS dosimeters under bulkbias control

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MOSFET DEVICES; RADIATION HARDENING; VOLTAGE CONTROL;

EID: 0032311599     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736516     Document Type: Article
Times cited : (25)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.