The space-charge dosimeter. General principles of a new method of radiation detection

Nuclear Instruments and Methods

Volumn 121, Issue 1, 1974, Pages 169-179

  Holmes Siedle, Andrew ^a  

^a UNIVERSITY OF READING   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETERS;

DOSIMETRY; INJURY; NUCLEAR RADIATION; THEORETICAL STUDY;

EID: 0016118460     PISSN: 0029554X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0029-554X(74)90153-0     Document Type: Article

References (26)

1. Metal-Oxide-Semiconductor X-Ray Detectors
2. The Physics of Failure of MIS Devices Under Radiation
3. Effects of ionizing radiation on oxidized silicon surfaces and planar devices
4. Radiation-induced space-charge buildup in MOS structures
5. Permanent Radiation Effects in Complementary-Symmetry MOS Integrated Circuits
6. Dependence of MOS Device Radiation-Sensitivity on Oxide Impurities
7. Process Techniques and Radiation Effects in Metal-Insulator Semiconductor Structures