Tunnelling currents in very narrow p+-n+ junctions

Thin Solid Films

Volumn 336, Issue 1-2, 1998, Pages 344-346

  Reitemann, G ^a   Kasper, E ^a   Kibbel, H ^b   Jorke, H ^b  

^a UNIVERSITY OF STUTTGART   (Germany)

^b DAIMLER AG   (Germany)

Author keywords

C V measurement; Influence of external ohmic load; Temperature behaviour of Esaki current; Tunnelling

Indexed keywords

CHROMIUM; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON TUNNELING; EPITAXIAL GROWTH; ETCHING; GOLD; MATHEMATICAL MODELS; METALLIZING; SEMICONDUCTOR DIODES; SEMICONDUCTOR DOPING; THERMAL EFFECTS; ZENER EFFECT;

ESAKI TUNNELING; ZENER TUNNELING;

HETEROJUNCTIONS;

EID: 0032309771     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01305-4     Document Type: Article

References (5)

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