Cut off frequency and transit time analysis of lightly doped drain (LDD) MOSFETs

Microelectronics Reliability

Volumn 38, Issue 12, 1998, Pages 1955-1961

  Thomas, Ciby ^a   Haldar, S ^b   Khanna, Manoj ^a   Rajesh, S ^a   Gupta, K K ^a   Gupta, R S ^a  

^a UNIVERSITY OF DELHI   (India)

^b UNIVERSITY OF DELHI   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC RESISTANCE; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DOPING; THRESHOLD VOLTAGE; TRANSCONDUCTANCE; TRANSIT TIME DEVICES;

CUT OFF FREQUENCY; FRINGING CAPACITANCE; TRANSIT TIME ANALYSIS;

MOSFET DEVICES;

EID: 0032308505     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(98)00065-1     Document Type: Article

References (16)

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