Test Generation and Fault Simulation for Cell Fault Model using Stuck-at Fault Model based Test Tools

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 13, Issue 3, 1998, Pages 315-319

  Psarakis, M ^a   Gizopoulos, D ^a   Paschalis, A ^a  

^a INSTITUTE OF INFORMATICS AND TELECOMMUNICATIONS   (Greece)

Author keywords

Cell fault model (CFM); Fault simulation; Stuck at fault model; Test pattern generation

Indexed keywords

AUTOMATIC TESTING; COMPUTER SIMULATION; EQUIVALENT CIRCUITS;

CELL FAULT MODEL (CFM); FAULT SIMULATION; TEST PATTERN GENERATION;

LOGIC CIRCUITS;

EID: 0032303527     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008389920806     Document Type: Article

References (10)

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