Design of a fast, easily testable ALU

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1996, Pages 9-16

  Blanton, R D ^a   Hayes, John P ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADDERS; CARRY LOGIC; COMPUTER HARDWARE; DIGITAL ARITHMETIC; ERROR DETECTION; FAILURE ANALYSIS; LOGIC CIRCUITS; LOGIC DESIGN; MATHEMATICAL MODELS;

ARITHMETIC LOGIC UNIT; CARRY LOOKAHEAD; LEVEL TESTABLE; TEST PATTERNS;

INTEGRATED CIRCUIT TESTING;

EID: 0029697687     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)