Experimental results from a microdot detector overcoated with a semiconducting layer

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 419, Issue 2-3, 1998, Pages 438-443

  Biagi, S F ^a   Duxbury, D ^b   Gabathuler, E ^a  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

^b ROYAL MARSDEN HOSPITAL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ARGON; BINARY MIXTURES; BORON; ETHERS; HELIUM; NEON; RADIATION DAMAGE; SEMICONDUCTING FILMS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DOPING; SILICON CARBIDE;

DIMETHYLETHER; MICRODOT DETECTORS; SEMICONDUCTOR DETECTORS;

PARTICLE DETECTORS;

EID: 0032298794     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)00818-3     Document Type: Article

References (8)

1. S.F. Biagi, J. Bordas, D. Duxbury, E. Gabathuler, Nucl. Instr. and Meth. A 392 (1997) 131.
2. H.S. Cho, W.S. Hong, J. Kadyk, V. Perez-Mendez, J.G. Kim, J. Vujic, Nucl. Instr. and Meth. A 401 (1997) 81.
3. S.F. Biagi, in preparation.
4. MAXWELL Electric field simulator, Ansoft Corporation.
5. S.F. Biagi, Private communication.
6. C.B. Opal, W.K. Peterson, E.C. Beaty, J.Chem. Phys. 55 4100 (1971).
7. S.F. Biagi, Nucl. Instr. and Meth. A 283 (1989) 716.
8. F. Sauli, Nucl. Phys. B (Proc. Suppl.) 61B (1998) 236.