Hard X-ray polarimetry exploiting directional information of the photoeffect in a charge coupled device

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3443, Issue , 1998, Pages 105-116

  Kotthaus, Rainer ^a   Buschhorn, Gerd W ^a   Rzepka, Matthias ^a   Schmidt, Klaus H ^a   Weinmann, Peter M ^a  

^a MAX PLANCK INSTITUT FÜR PHYSIK   (Germany)

Author keywords

CCD; Parametric X radiation; Photoeffect; X ray polarimetry

Indexed keywords

ATOMIC SPECTROSCOPY; CHARGE COUPLED DEVICES; DIFFRACTION; DIGITAL CAMERAS; ELECTRON BEAMS; ELECTRON GUNS; ELECTRONS; ELLIPSOMETRY; EMISSION SPECTROSCOPY; HOLOGRAPHIC INTERFEROMETRY; INTEGRATED CIRCUITS; MEASUREMENT ERRORS; MOLECULAR SPECTROSCOPY; MONTE CARLO METHODS; PARTICLE BEAMS; PHOTONS; POLARIZATION; SEMICONDUCTING SILICON COMPOUNDS; SIGNAL PROCESSING; SILICON WAFERS; SINGLE CRYSTALS; SPECTRUM ANALYSIS; ULTRAVIOLET SPECTROSCOPY; X RAY ANALYSIS; X RAYS; ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROMAGNETIC WAVE POLARIZATION; LINEAR ACCELERATORS; MOS DEVICES; PHOTOEMISSION; SILICON; SYNCHROTRON RADIATION;

ANALYZING POWERS; CCD; CHARGE CLUSTERS; DIRECTIONAL INFORMATIONS; ELECTRON BEAM DIRECTIONS; EMITTANCE; KINEMATICAL THEORIES; LINEAR POLARIZATIONS; LOCAL LINEAR; MONOCHROMATIC SYNCHROTRON RADIATIONS; MONTE CARLO SIMULATIONS; PARAMETRIC X-RADIATION; PHOTOEFFECT; PHOTOELECTRON EMISSIONS; POLARIZATION MEASUREMENTS; POLARIZATION PLANES; POLARIZATION VECTORS; SILICON SINGLE CRYSTALS; SIMULTANEOUS MEASUREMENTS; SMALL CHARGES; SUPERCONDUCTING LINEAR ACCELERATORS; X-RAY POLARIMETRY; PARAMETRIC X RADIATION; X RAY POLARIMETRY;

POLARIMETERS;

EID: 0032291745     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.333604     Document Type: Conference Paper

References (23)

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