X-ray polarimetry and position measurement using the photoeffect and diffusion in a CCD

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2808, Issue , 1996, Pages 230-241

  Schmidt, Klaus H ^a   Buschhorn, Gerd ^a   Kotthaus, Rainer ^a   Rzepka, Matthias ^a   Weinniann, Peter M ^a  

^a MAX PLANCK INSTITUT FÜR PHYSIK   (Germany)

Author keywords

CCD; parametric X rays; sub pixel resolution; X ray polarimetry

Indexed keywords

LINEAR POLARIZATION; MONOCHROMATIC SYNCHROTRON RADIATION; PARAMETRIC X-RAYS; PLANAR CHANNELING; SIMULTANEOUS MEASUREMENT; SUBPIXEL ACCURACY; SUBPIXEL RESOLUTION; X-RAY POLARIMETRY;

ASTRONOMY; CHARGE COUPLED DEVICES; ELLIPSOMETRY; GAMMA RAYS; MEASUREMENTS; POLARIMETERS; POLARIZATION;

X RAYS;

EID: 0005245002     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.255997     Document Type: Conference Paper

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