Direct measurement of substrate refractive indices and determination of layer indices in slab-guiding structures

Applied Optics

Volumn 36, Issue 12, 1997, Pages 2545-2553

  Paraire, Nicole A ^a   Moresmau, Nathalie ^a   Chen, Shufen ^a,b   Dansas, Pierre ^a   Bertrand, Florent ^a  

^a CNRS   (France)

^b BEIJING INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Direct refractive index measurements; Grating waveguide; InP; Near band gap semiconductor index; Refractive index temperature coefficients

Indexed keywords

EID: 0000816018     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.002545     Document Type: Article

References (31)

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