Leem measurements of step energies at the (001) surface of heavily boron-doped silicon

Surface Review and Letters

Volumn 5, Issue 6, 1998, Pages 1159-1165

  Hannon, J B ^a   Swartzentruber, B S ^a   Kellogg, G L ^a   Bartelt, N C ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032283586     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X98001493     Document Type: Article

References (14)

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