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Volumn 15, Issue 11, 1998, Pages 837-839

Photoluminescence properties of a-SiC:H films grown by plasma enhanced chemical vapor deposition from SiH4+C2H2 gas mixtures

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CARBON FILMS; DEFECT DENSITY; PHOTOLUMINESCENCE; PLASMA CVD; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SILICON CARBIDE;

EID: 0032265524     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/15/11/020     Document Type: Article
Times cited : (2)

References (10)
  • 5
    • 0004258378 scopus 로고
    • edited by A. Madan, M. J. Thompson, P. C. Taylor, Y. Hamakawa and P. G. LeComber Materials Research Society, Pittsburg, Pennsylvania
    • Y. Nakayama, S. Akita, K. Wakita and T. Kawamura, Amorphous Silicon Technology-1088, edited by A. Madan, M. J. Thompson, P. C. Taylor, Y. Hamakawa and P. G. LeComber (Materials Research Society, Pittsburg, Pennsylvania, 1988) Vol. 118, p. 73.
    • (1988) Amorphous Silicon Technology-1088 , vol.118 , pp. 73
    • Nakayama, Y.1    Akita, S.2    Wakita, K.3    Kawamura, T.4
  • 6
    • 6244230099 scopus 로고
    • edited by A. Madan, M. J. Thompson, P. C. Taylor, Y. Hamakawa and P. G. LeComber Materials Research Society, Pittsburg, Pennsylvania
    • S. Akita, Y. Nakayama, M. Yamano and T. Kawamura, Amorphous Silicon Technology-1989, edited by A. Madan, M. J. Thompson, P. C. Taylor, Y. Hamakawa and P. G. LeComber (Materials Research Society, Pittsburg, Pennsylvania, 1989) Vol. 149, p. 167.
    • (1989) Amorphous Silicon Technology-1989 , vol.149 , pp. 167
    • Akita, S.1    Nakayama, Y.2    Yamano, M.3    Kawamura, T.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.