Fringe pattern analysis methods: Up-to-date review

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3407, Issue , 1998, Pages 56-66

  Kujawińska, Małgorzata ^a   Osten, Wolfgang ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Absolute phase measurement; Automatic fringe pattern analysis; Optical metrology; Phase measuring methods; Phase unwrapping

Indexed keywords

COMPUTER AIDED ANALYSIS; IMAGE CODING; INTERFEROMETRY; OPTICAL VARIABLES MEASUREMENT;

FRINGE PATTERN ANALYSIS; PHASE MEASURING METHODS;

IMAGE PROCESSING;

EID: 0032224934     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.323363     Document Type: Conference Paper

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