Variation of the complex refractive indices with Sb-addition in Ge-Sb-Te alloy and their wavelength dependence

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3401, Issue , 1998, Pages 112-115

  Kim, Sang Y ^a   Kim, Sang J ^a   Seo, Hun ^a   Kim, Myong R ^a  

^a Ajou University   (South Korea)

Author keywords

Complex refractive index; Ge Sb Te alloy; Phase change optical disk; Spectroscopic ellipsometry

Indexed keywords

ELLIPSOMETRY; FLUORESCENCE; GERMANIUM ALLOYS; INDUCTIVELY COUPLED PLASMA; LIGHT REFLECTION; MAGNETRON SPUTTERING; OPTICAL MATERIALS; REFRACTIVE INDEX; SPECTROMETERS; X RAYS;

ATOMIC EMISSION SPECTROMETERS;

OPTICAL RECORDING;

EID: 0032224205     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.327935     Document Type: Conference Paper

References (7)

1. 5 used for phase change disks
2. Optical properties of phase change materials for optical recording
3. Potentiality of the Ag-In-Sb-Te phase change recording material for high density erasable optical discs
4. Compact disc erasable (CD-E) with Ag-In-Sb-Te phase-change recording material
5. Calculation of optical constants, n and k, in the interband region
6. Simultaneous determination of refractive index, its dispersion and depth-profile of magnesium oxide thin film by spectroscopic ellipsometry
7. Simultaneous determination of refractive index, extinction coefficient and void distribution of titanium dioxide thin film using optical methods