Measurement precision in surface Brillouin scattering

Journal of the Optical Society of America B: Optical Physics

Volumn 15, Issue 9, 1998, Pages 2481-2489

  Stoddart, P R ^a   Crowhurst, J C ^a   Every, A G ^a   Comins, J D ^a  

^a UNIVERSITY OF THE WITWATERSRAND   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; COMPUTATIONAL GEOMETRY; FILMS; LIGHT POLARIZATION; MULTILAYERS; SILICON; SINGLE CRYSTALS; SPECTROSCOPY; SURFACE ROUGHNESS; SURFACE STRUCTURE; ULTRASONIC MEASUREMENT;

SINGLE CRYSTAL SILICON; SURFACE BRILLOUIN SCATTERING SPECTROSCOPY;

BRILLOUIN SCATTERING;

EID: 0032219355     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.15.002481     Document Type: Article

References (23)

1. F. Nizzoli and J. R. Sandercock, "Surface Brillouin scattering from phonons," in Dynamical Properties of Solids, G. K. Horton and A. A. Maradudin, eds. (North-Holland, Amsterdam, 1990), pp. 281-335.
2. M. Mendik, S. Sathish, A. Kulik, G. Gremaud, and P. Wachter, "Surface acoustic wave studies on single-crystal nickel using Brillouin scattering and scanning acoustic microscopy," J. Appl. Phys. 71, 2830-2834 (1992).
3. M. W. Elmiger, "Raman scattering under high pressure in samarium selenide and Brillouin spectroscopy from surface acoustic waves," Doctoral dissertation (Eidgenössische Technische Hochschule, Zurich, Switzerland, 1988).
4. P. R. Stoddart, J. D. Comins, and A. G. Every, "Brillouin-scattering measurements of surface-acoustic-wave velocities in silicon at high temperatures," Phys. Rev. B 51, 17,574-17,578 (1995).
5. J. R. Sandercock, "Light scattering from surface acoustic phonons in metals and semiconductors," Solid State Commun. 26, 547-551 (1978).
6. V. R. Velasco and F. Garcia-Moliner, "Brillouin scattering from surface waves," Solid State Commun. 33, 1-5 (1980).
7. P. Mutti, C. E. Bottani, G. Ghislotti, M. Beghi, G. A. D. Briggs, and J. R. Sandercock, "Surface Brillouin scattering - extending surface wave measurements to 20 GHz," in Advances in Acoustic Microscopy, A. Briggs, ed. (Plenum, New York, 1995), Vol. 1, pp. 249-300.
8. M. Ezz-el-Arab, B. Galperin, J. Brielles, and B. Vodar, "Variation des vitesses de propagation des ultrasons dans le silicium monocrystallin entre 25° et 83 °C," Solid State Commun. 6, 387-390 (1968).
9. M. G. Beghi, C. E. Bottani, P. M. Ossi, T. A. Lafford, and B. K. Tanner, "Combined surface Brillouin scattering and x-ray reflectivity characterization of thin metallic films," J. Appl. Phys. 81, 672-678 (1997); R. Jorna, D. Visser, V. Bortolani, and F. Nizzoli, "Elastic and vibrational properties of nickel films measured by surface Brillouin scattering," J. Appl. Phys. 65, 718-825 (1989).
10. M. G. Beghi, C. E. Bottani, P. M. Ossi, T. A. Lafford, and B. K. Tanner, "Combined surface Brillouin scattering and x-ray reflectivity characterization of thin metallic films," J. Appl. Phys. 81, 672-678 (1997); R. Jorna, D. Visser, V. Bortolani, and F. Nizzoli, "Elastic and vibrational properties of nickel films measured by surface Brillouin scattering," J. Appl. Phys. 65, 718-825 (1989).
11. R. Loudon and J. R. Sandercock, "Analysis of the light scattering cross section for surface ripples on solids," J. Phys. C 13, 2609-2622 (1980).
12. G. S. Agarwal, "Interaction of electromagnetic waves at rough dielectric surfaces," Phys. Rev. B 15, 2371-2383 (1977).
13. R. Loudon, "Theory of surface-ripple Brillouin scattering by solids," Phys. Rev. Lett. 40, 581-583 (1978).
14. K. R. Subbaswamy and A. A. Maradudin, "Photoelastic and surface-corrugation contributions to Brillouin scattering from an opaque crystal," Phys. Rev. B 18, 4181-4199 (1978).
15. V. Bortolani, F. Nizzoli, and G. Santoro, "Surface density of acoustic phonons in GaAs," Phys. Rev. Lett. 41, 39-42 (1978).
16. J. A. Bell, R. J. Zanoni, C. T. Seaton, G. I. Stegeman, W. R. Bennet, and C. Falco, "Brillouin scattering from Love waves in Cu/Nb metallic superlattices," Appl. Phys. Lett. 51, 652-654 (1987).
17. G. W. Farnell, "Properties of elastic surface waves," in Physical Acoustics-Principles and Methods, W. P. Mason and R. N. Thurston, eds. (Academic, New York, 1970), Vol. VI, pp. 109-166.
18. J. O. Kim and R. D. Weglein, "Comment on 'Surface acoustic wave studies on single crystal nickel using Brillouin scattering and scanning acoustic microscope,'" J. Appl. Phys. 75, 5459-5460 (1994).
19. M. M. Puentes-Heras and O. Kolosov, Department of Materials, University of Oxford, Parks Road, Oxford OX13PH, England (personal communication, 1997).
20. A. E. Kadyshevich, V. M. Beilin, Yu. Kh. Vekilov, O. M. Krasil'nikov, and V. N. Podd'yakov, "Investigation of the influence of free current carriers on the elastic constants of germanium and silicon," Fiz. Tverd. Tela Leningrad 9, 1861-1867 (1967) [Sov. Phys. Solid State 9, 1467-1472 (1968)]; R. W. Keyes, "Device implications of the electronic effect in the elastic constants of silicon," IEEE Trans. Sonics Ultrason. SU-29, 99-103 (1982).
21. A. E. Kadyshevich, V. M. Beilin, Yu. Kh. Vekilov, O. M. Krasil'nikov, and V. N. Podd'yakov, "Investigation of the influence of free current carriers on the elastic constants of germanium and silicon," Fiz. Tverd. Tela Leningrad 9, 1861-1867 (1967) [Sov. Phys. Solid State 9, 1467-1472 (1968)]; R. W. Keyes, "Device implications of the electronic effect in the elastic constants of silicon," IEEE Trans. Sonics Ultrason. SU-29, 99-103 (1982).
22. A. E. Kadyshevich, V. M. Beilin, Yu. Kh. Vekilov, O. M. Krasil'nikov, and V. N. Podd'yakov, "Investigation of the influence of free current carriers on the elastic constants of germanium and silicon," Fiz. Tverd. Tela Leningrad 9, 1861-1867 (1967) [Sov. Phys. Solid State 9, 1467-1472 (1968)]; R. W. Keyes, "Device implications of the electronic effect in the elastic constants of silicon," IEEE Trans. Sonics Ultrason. SU-29, 99-103 (1982).
23. A. G. Eguiluz and A. A. Maradudin, "Frequency shift and attenuation length of a Rayleigh wave due to surface roughness," Phys. Rev. B 28, 728-747 (1983).