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Volumn 6, Issue 6, 1998, Pages 393-399

Segregation and Local Structure at Grain Boundaries in SiO2-Doped Tetragonal ZrO2 Polycrystalline Materials

Author keywords

Grain boundary; Microanalysis; Microstructure; Segregation; Y stabilized zro2

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL MICROSTRUCTURE; CRYSTAL STRUCTURE; DEFORMATION; DIFFUSION IN SOLIDS; DOPING (ADDITIVES); ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; POLYCRYSTALLINE MATERIALS; SILICA; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS;

EID: 0032206366     PISSN: 10647562     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1021876805121     Document Type: Article
Times cited : (9)

References (14)
  • 4
    • 3142540120 scopus 로고    scopus 로고
    • Y. Ishida, M. Monta, T. Suga, H. Ichinose, O. Ohashi and J. Echigoya, eds Japan Institute of Metals
    • M. Z. Berbon and T. G. Langdon, Interface Science and Materials Interconnection, Y. Ishida, M. Monta, T. Suga, H. Ichinose, O. Ohashi and J. Echigoya, eds (Japan Institute of Metals, 1996), pp. 122-129.
    • (1996) Interface Science and Materials Interconnection , pp. 122-129
    • Berbon, M.Z.1    Langdon, T.G.2
  • 10
    • 0000669690 scopus 로고
    • J. N. Chapman and A. J. Craven, eds. SUSSP Publication, Edinburgh
    • C. Colliex and C. Mory, Quantitative Electron Microscopy, J. N. Chapman and A. J. Craven, eds. (SUSSP Publication, Edinburgh, 1984), pp. 149-216.
    • (1984) Quantitative Electron Microscopy , pp. 149-216
    • Colliex, C.1    Mory, C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.