Some applications of elastic peak electron spectroscopy for semiconductor surface studies

Surface and Interface Analysis

Volumn 26, Issue 12, 1998, Pages 903-907

  Bideux, L ^a,b   Robert, C ^a   Merle, S ^a   Gruzza, B ^a   Goumet, E ^a   Gil Lafon, E ^a  

^a UNIVERSITÉ BLAISE PASCAL   (France)

^b UNIVERSITÉ CLERMONT AUVERGNE   (France)

Author keywords

Electron spectroscopy; EPES; IMFP; Monte Carlo

Indexed keywords

COMPUTER SIMULATION; ELECTRON SPECTROSCOPY; GOLD; HETEROJUNCTIONS; MONTE CARLO METHODS;

ELASTIC PEAK ELECTRON SPECTROSCOPY (EPES);

SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 0032204471     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199811)26:12<903::AID-SIA436>3.0.CO;2-1     Document Type: Article

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