Crystallization and microstructural evolution of cordierite-based thick film dielectrics

Acta Materialia

Volumn 46, Issue 18, 1998, Pages 6421-6430

  Cho, Y S ^a   Hoelzer, D T ^a   Schulze, W A ^a   Amarakoon, V R W ^a  

^a ALFRED UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CERAMIC MATERIALS; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; GLASS; HIGH TEMPERATURE EFFECTS; INTERFACES (MATERIALS); LEAD COMPOUNDS; MAGNESIA; NUCLEATION; SILICA;

CORDIERITES;

DIELECTRIC FILMS;

EID: 0032203161     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(98)00307-3     Document Type: Article

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