Characterizing the commercial avionics thermal environment for field reliability assessment

Institute of Environmental Sciences - Proceedings, Annual Technical Meeting

Volumn , Issue , 1996, Pages 50-57

  Cluff, Kevin D ^a   Barker, Donald B ^a   Robbins, Dan ^a   Edwards, Tom ^a  

^a HONEYWELL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AVIONICS; ELECTRONICS ENGINEERING; FATIGUE TESTING; PRINTED CIRCUIT BOARDS; RELIABILITY; SOLDERED JOINTS; THERMAL EFFECTS; VISCOPLASTICITY;

RAINFLOW CYCLE COUNTING;

ENVIRONMENTAL TESTING;

EID: 0030314495     PISSN: 00739227     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)