Nanoindentation Measurement for a Tungsten (001) Single Crystal

JSME International Journal, Series A: Mechanics and Material Engineering

Volumn 41, Issue 4, 1998, Pages 562-568

  Miyahara, Kensuke ^a   Matsuoka, Saburo ^a   Nagashima, Nobuo ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

AFM; AFM Ultra Micro Hardness Tester; Hardness; Nanoindentation; Radius of Curvature; Tungsten; Upper Lower Yield Stress

Indexed keywords

ATOMIC FORCE MICROSCOPY; HARDNESS TESTING; MICROHARDNESS; SHEAR STRESS; TUNGSTEN; X RAY CRYSTALLOGRAPHY; YIELD STRESS;

NANOINDENTATION MEASUREMENTS; ULTRA-MICROHARDNESS TESTING;

SINGLE CRYSTALS;

EID: 0032184438     PISSN: 13408046     EISSN: None     Source Type: Journal    
DOI: 10.1299/jsmea.41.562     Document Type: Article

References (6)

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