Measurement of elastic modulus and yield stress by AFM ultra-micro-hardness tester

Nippon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A

Volumn 62, Issue 598, 1996, Pages 1432-1437

  Matsuoka, Saburo ^a   Miyahara, Kensuke ^a   Nagashima, Nobuo ^a   Tanaka, Kohichi ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; FINITE ELEMENT METHOD; GLASS; HARDNESS TESTING; SILICON; STEEL; YIELD STRESS;

ATOMIC FORCE MICROSCOPE NANOINDENTER; FORCE PENETRATION CURVES; PENETRATION DEPTH; ULTRAMICROHARDNESS APPARATUS; YIELD FORCE;

ELASTOPLASTICITY;

EID: 0030173585     PISSN: 03875008     EISSN: None     Source Type: Journal    
DOI: 10.1299/kikaia.62.1432     Document Type: Article

References (8)