Characterisation of structured thin films made from complex materials by photoabsorption spectromicroscopy

Applied Physics A: Materials Science and Processing

Volumn 67, Issue 4, 1998, Pages 447-454

  Swiech, W ^a   Fecher, G H ^b   Huth, M ^b   Schmidt, O ^b   Cheng, N F ^c   Lin, C K ^c   Tung, C Y ^c   Hwu, Y ^c  

^a University of Illinois at Urbana Champaign   (United States)

^b JOHANNES GUTENBERG UNIVERSITY   (Germany)

^c INSTITUTE OF PHYSICS   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; COMPOSITION; ELECTRON MICROSCOPY; ELECTRONS; HIGH TEMPERATURE SUPERCONDUCTORS; INTERFACES (MATERIALS); OXIDE SUPERCONDUCTORS; PHOTONS; PHYSICAL PROPERTIES; SINGLE CRYSTALS; SURFACES; SYNCHROTRON RADIATION;

OXYGEN RELATED DEFECTS; PHOTOABSORPTION SPECTROMICROSCOPY; PHOTOEMISSION ELECTRON MICROSCOPY; X RAY ABSORPTION;

THIN FILMS;

EID: 0032181742     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050802     Document Type: Article

References (23)

1. E. Umbach: Physica B 208&209, 193 (1995); G. Margaritondo, F. Cerrina: Nucl. Instram. Methods A 291, 26 (1990); G. Margaritondo: Scann. Spectromicrosc. 9, 949 (1995); For a recent review see H. Ade (Ed.): J. Electron Spectrosc. Relat. Phenom. 84 (1997)
2. E. Umbach: Physica B 208&209, 193 (1995); G. Margaritondo, F. Cerrina: Nucl. Instram. Methods A 291, 26 (1990); G. Margaritondo: Scann. Spectromicrosc. 9, 949 (1995); For a recent review see H. Ade (Ed.): J. Electron Spectrosc. Relat. Phenom. 84 (1997)
3. E. Umbach: Physica B 208&209, 193 (1995); G. Margaritondo, F. Cerrina: Nucl. Instram. Methods A 291, 26 (1990); G. Margaritondo: Scann. Spectromicrosc. 9, 949 (1995); For a recent review see H. Ade (Ed.): J. Electron Spectrosc. Relat. Phenom. 84 (1997)
4. E. Umbach: Physica B 208&209, 193 (1995); G. Margaritondo, F. Cerrina: Nucl. Instram. Methods A 291, 26 (1990); G. Margaritondo: Scann. Spectromicrosc. 9, 949 (1995); For a recent review see H. Ade (Ed.): J. Electron Spectrosc. Relat. Phenom. 84 (1997)
5. Y. Hwu, C.Y. Tung, J.Y. Pieh, S.D. Lee, P. Alméras, F. Gozzo, H. Berger, G. Margaritondo, G. De Stasio, D. Mercanti, M.T. Ciotti: Nucl. Instrum. Methods A 361, 349 (1995); G. Margantondo, Y. Hwu: Appl. Surf. Sci. 92, 273 (1996)
6. Y. Hwu, C.Y. Tung, J.Y. Pieh, S.D. Lee, P. Alméras, F. Gozzo, H. Berger, G. Margaritondo, G. De Stasio, D. Mercanti, M.T. Ciotti: Nucl. Instrum. Methods A 361, 349 (1995); G. Margantondo, Y. Hwu: Appl. Surf. Sci. 92, 273 (1996)
7. M. Jourdan, M. Huth, H. Adrian: Czech J. Phys. 46, 789 (1996); C. Geibel, C. Schank, S. Thies, H. Kitazawa, C.D. Bredl, A. Boehm, M. Rau, A. Grauel, R. Caspary, R. Helfrich, U. Ahlheim, G. Weber, F. Steglich: Z. Phys. B: Condens. Matter 84, 1 (1991)
8. M. Jourdan, M. Huth, H. Adrian: Czech J. Phys. 46, 789 (1996); C. Geibel, C. Schank, S. Thies, H. Kitazawa, C.D. Bredl, A. Boehm, M. Rau, A. Grauel, R. Caspary, R. Helfrich, U. Ahlheim, G. Weber, F. Steglich: Z. Phys. B: Condens. Matter 84, 1 (1991)
9. M. Huth, A. Kaldowski, J. Hessert, T. Steinborn, H. Adrian: Solid State Commun. 87, 1133 (1993); M. Huth, A. Kaldowski, J. Hessert, C. Heske, H. Adrian: Physica B 199&200, 116 (1994)
10. M. Huth, A. Kaldowski, J. Hessert, T. Steinborn, H. Adrian: Solid State Commun. 87, 1133 (1993); M. Huth, A. Kaldowski, J. Hessert, C. Heske, H. Adrian: Physica B 199&200, 116 (1994)
11. G. Jakob, P. Przyslupski, C. Stölzel, C. Tomé-Rosa, A. Walkenhorst, M. Schmitt, H. Adrian: Appl. Phys. Lett. 59, 1626 (1991); G. Jakob, T. Hahn, C. Stölzel, C. Tomé-Rosa, H. Adrian: Europhys. Lett. 19, 135 (1992)
12. G. Jakob, P. Przyslupski, C. Stölzel, C. Tomé-Rosa, A. Walkenhorst, M. Schmitt, H. Adrian: Appl. Phys. Lett. 59, 1626 (1991); G. Jakob, T. Hahn, C. Stölzel, C. Tomé-Rosa, H. Adrian: Europhys. Lett. 19, 135 (1992)
13. W. Gudat, C. Kunz: Phys. Rev. Lett. 29, 169 (1972)
14. M. Cardonna, L. Ley (Eds.): Photoemission in Solids I: General Principles (Springer, Berlin, Heidelberg 1987)
15. B.P. Tonner, G.R. Harp: Rev. Sci. Instrum. 59, 853 (1988); J. Stöhr, Y. Wu, B.D. Hermsmeier, M.G. Samant, G.R. Harp, S. Koranda, D. Dunham, B.P. Tonner: Science 259, 658 (1993)
16. B.P. Tonner, G.R. Harp: Rev. Sci. Instrum. 59, 853 (1988); J. Stöhr, Y. Wu, B.D. Hermsmeier, M.G. Samant, G.R. Harp, S. Koranda, D. Dunham, B.P. Tonner: Science 259, 658 (1993)
17. J.C. Fuggle, N. Martensson: J. Electron Spectrosc. Relat. Phenom. 21, 275 (1980)
18. R.C. Weast, M.J. Astle (Eds.): CRC Handbook of Chemistry and Physics (CRC Press, Boca Raton, FA 1996)
19. C.T. Chen, L.H. Tjeng, J. Kwo, H.L. Kao, P. Rudolf, F. Sette, R.M. Fleming: Phys. Rev. Lett. 68, 2543 (1992)
20. W. Swiech, G.H. Fecher, Ch. Ziethen, O. Schmidt, G. Schoenhense, K. Grzelakowski, C.M. Schneider, R. Froemter, J. Kirschner: J. Electron Spectrosc. Relat. Phenom. 84, 171 (1997); B.P. Tonner, D. Dunham, T. Droubay, J. Kikuma, J. Delinger, E. Rotenberg, A. Warwick: J. Electron Spectrosc. Relat. Phenom. 75, 309 (1995); F.U. Hillebrecht, T. Kinoshita, D. Spanke, J. Dresselhaus, C. Roth, H.B. Rose, E. Kisker: Phys. Rev. Lett. 75, 2224 (1995)
21. W. Swiech, G.H. Fecher, Ch. Ziethen, O. Schmidt, G. Schoenhense, K. Grzelakowski, C.M. Schneider, R. Froemter, J. Kirschner: J. Electron Spectrosc. Relat. Phenom. 84, 171 (1997); B.P. Tonner, D. Dunham, T. Droubay, J. Kikuma, J. Delinger, E. Rotenberg, A. Warwick: J. Electron Spectrosc. Relat. Phenom. 75, 309 (1995); F.U. Hillebrecht, T. Kinoshita, D. Spanke, J. Dresselhaus, C. Roth, H.B. Rose, E. Kisker: Phys. Rev. Lett. 75, 2224 (1995)
22. W. Swiech, G.H. Fecher, Ch. Ziethen, O. Schmidt, G. Schoenhense, K. Grzelakowski, C.M. Schneider, R. Froemter, J. Kirschner: J. Electron Spectrosc. Relat. Phenom. 84, 171 (1997); B.P. Tonner, D. Dunham, T. Droubay, J. Kikuma, J. Delinger, E. Rotenberg, A. Warwick: J. Electron Spectrosc. Relat. Phenom. 75, 309 (1995); F.U. Hillebrecht, T. Kinoshita, D. Spanke, J. Dresselhaus, C. Roth, H.B. Rose, E. Kisker: Phys. Rev. Lett. 75, 2224 (1995)
23. For a recent review, see, for example, R. Imbihl, G. Ertl: Chem. Rev. 95(3), 697 (1995)