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Volumn 136, Issue 1-2, 1998, Pages 81-86
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Thermally induced phase transition in crystalline lead phthalocyanine films investigated by XRD and atomic force microscopy
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Author keywords
Atomic force microscopy; Morphology; Other(phthalocyanine); X ray diffraction
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
CRYSTAL ORIENTATION;
LEAD COMPOUNDS;
MORPHOLOGY;
ORGANOMETALLICS;
PHASE TRANSITIONS;
SILICON;
SUBSTRATES;
THERMAL EFFECTS;
X RAY CRYSTALLOGRAPHY;
LEAD PHTHALOCYANINE;
CONDUCTIVE FILMS;
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EID: 0032181330
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(98)00315-8 Document Type: Article |
Times cited : (42)
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References (11)
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