Evaluation of iteration methods used when modeling scattering from features on surfaces using the discrete-dipole approximation

Journal of Quantitative Spectroscopy and Radiative Transfer

Volumn 60, Issue 3, 1998, Pages 493-500

  Nebeker, Brent M ^a   Starr, Greg W ^a   Hirleman, E Dan ^a  

^a Arizona State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT SCATTERING; SILICON WAFERS; SURFACE SCATTERING; APPROXIMATION THEORY; CONVERGENCE OF NUMERICAL METHODS; IMPURITIES; ITERATIVE METHODS; MATHEMATICAL MODELS; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES;

CIRCUIT COMPONENTS; DISCRETE DIPOLE APPROXIMATION; DISCRETE DIPOLE APPROXIMATION METHOD; ITERATION METHOD; MINIMAL RESIDUAL METHODS; NUMERICAL ASPECTS;

ITERATIVE METHODS; LIGHT SCATTERING;

COMPLEX CONJUGATE GRADIENT METHOD; DISCRETE DIPOLE APPROXIMATION; MICROCIRCUIT COMPONENTS;

EID: 0032165332     PISSN: 00224073     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-4073(98)00023-5     Document Type: Article

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