Contact damage and strength degradation in brittle/quasi-plastic silicon nitride bilayers

Journal of the American Ceramic Society

Volumn 81, Issue 9, 1998, Pages 2394-2404

  Lee, Kee Sung ^a,b   Lee, Seung Kun ^a,c,d   Lawn, Brian R ^a,c   Kim, Do Kyung ^b,c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^c Amercian Ceramic Society ^*

^d CATERPILLAR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BONDING; BRITTLENESS; CRACK PROPAGATION; CRYSTAL MICROSTRUCTURE; ELASTOPLASTICITY; STRENGTH OF MATERIALS; SUBSTRATES; TOUGHNESS;

CONTACT DAMAGE;

SILICON NITRIDE;

EID: 0032165250     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1998.tb02635.x     Document Type: Article

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