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Volumn 412-413, Issue , 1998, Pages 405-414

An estimate of the electron effective mass in titanium nitride using UPS and EELS

Author keywords

Electron energy loss spectroscopy; Plasmons; Soft X ray photoelectron spectroscopy (using synchrotron radiation); Sputter deposition; Surface electronic phenomena; Titanium nitride

Indexed keywords

BAND STRUCTURE; CARRIER CONCENTRATION; COMPOSITION EFFECTS; ELECTRON ENERGY LOSS SPECTROSCOPY; FERMI LEVEL; PHOTOEMISSION; PHOTONS; SPUTTER DEPOSITION; SURFACE PHENOMENA; SYNCHROTRON RADIATION; ULTRAVIOLET SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0032164813     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00459-2     Document Type: Article
Times cited : (39)

References (46)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.