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Volumn 2, Issue , 1996, Pages 1413-1418
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Fast and accurate ADC testing via an enhanced sine wave fitting algorithm
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
ANALOG TO DIGITAL CONVERSION;
COMPUTER SIMULATION;
ELECTRONIC EQUIPMENT TESTING;
ERRORS;
ESTIMATION;
PERFORMANCE;
PROBABILITY DENSITY FUNCTION;
SIGNAL TO NOISE RATIO;
SPURIOUS SIGNAL NOISE;
TRANSFER FUNCTIONS;
WAVEFORM ANALYSIS;
DEVICE UNDER TEST;
HISTOGRAM TEST;
SINE WAVE FITTING;
WAVEFORM RECORDERS;
WEIGHTED MEAN SQUARE ERROR;
CURVE FITTING;
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EID: 0029698532
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (14)
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