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Volumn 19, Issue 3-4, 1998, Pages 219-229

Metrological qualification of data acquisition systems

Author keywords

Data acquisition; Error characterization; Standardization; Test methods

Indexed keywords

CALCULATIONS; COMPUTER SIMULATION; DATA STORAGE EQUIPMENT; MEASUREMENT ERRORS; STANDARDIZATION; STANDARDS;

EID: 0032157271     PISSN: 09205489     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5489(98)00019-1     Document Type: Article
Times cited : (6)

References (11)
  • 1
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    • IEEE standard for digitizing waveform recorders
    • Dec.
    • IEEE standard for digitizing waveform recorders, IEEE Std. 1057-94 (Dec. 1994).
    • (1994) IEEE Std. 1057-94
  • 2
    • 0022882017 scopus 로고
    • Design and test aspects of a 4-MHz 12-bit analog-to-digital converters
    • A. Gee, Design and test aspects of a 4-MHz 12-bit analog-to-digital converters, IEEE Trans. Instr. Meas. 35 (1986) 483-491.
    • (1986) IEEE Trans. Instr. Meas. , vol.35 , pp. 483-491
    • Gee, A.1
  • 4
    • 0028446234 scopus 로고
    • Histogram measurement of ADC nonlinearities using sine waves
    • J. Blair, Histogram measurement of ADC nonlinearities using sine waves, IEEE Trans. Instr. Meas. 43 (1994) 384-388.
    • (1994) IEEE Trans. Instr. Meas. , vol.43 , pp. 384-388
    • Blair, J.1
  • 5
    • 0031200280 scopus 로고    scopus 로고
    • Fast and accurate ADC testing via an enhanced sine wave fitting algorithm
    • N. Giaquinto, A. Trotta, Fast and accurate ADC testing via an enhanced sine wave fitting algorithm, IEEE Trans. Instr. Meas. 46 (1997) 1020-1025.
    • (1997) IEEE Trans. Instr. Meas. , vol.46 , pp. 1020-1025
    • Giaquinto, N.1    Trotta, A.2
  • 6
    • 0030128149 scopus 로고    scopus 로고
    • Testing and optimizing ADC performance: A probabilistic approach
    • N. Giaquinto, M. Savino, A. Trotta, Testing and optimizing ADC performance: a probabilistic approach, IEEE Trans. Instr. Meas. 45 (1996) 621-626.
    • (1996) IEEE Trans. Instr. Meas. , vol.45 , pp. 621-626
    • Giaquinto, N.1    Savino, M.2    Trotta, A.3
  • 9
    • 0028449871 scopus 로고
    • An improved code density test for the dynamic characterization of flash A/D converters
    • C. Morandi, L. Niccolai, An improved code density test for the dynamic characterization of flash A/D converters, IEEE Trans. Instr. Meas. 43 (1994) 384-388.
    • (1994) IEEE Trans. Instr. Meas. , vol.43 , pp. 384-388
    • Morandi, C.1    Niccolai, L.2
  • 10
    • 0029357526 scopus 로고
    • A critical note on histogram testing of data acquisition channels
    • J. Schoukens, A critical note on histogram testing of data acquisition channels, IEEE Trans. Instr. Meas. 44 (1995) 860-863.
    • (1995) IEEE Trans. Instr. Meas. , vol.44 , pp. 860-863
    • Schoukens, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.