Interpretation of high resolution transmission electron microscope images of short range ordered Ni4Mo

Materials Transactions, JIM

Volumn 39, Issue 9, 1998, Pages 914-919

  Hata, Satoshi ^a   Shindo, Daisuke ^b   Kuwano, Noriyuki ^a   Matsumura, Syo ^a   Oki, Kensuke ^a  

^a KYUSHU UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

Dynamical diffraction effects of electrons; High resolution transmission electron microscopy (HRTEM); Image contrast; Multi slice simulations; Projection contrast; Short range order (SRO) in Ni4Mo

Indexed keywords

COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; CRYSTAL LATTICES; ELECTRON DIFFRACTION; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

FACE CENTERED CUBIC (FCC) STRUCTURE; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM); MULTI-SLICE SIMULATIONS;

NICKEL ALLOYS;

EID: 0032157194     PISSN: 09161821     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans1989.39.914     Document Type: Article

References (11)

1. G. Van Tendeloo, S. Amelinckx and D. De Fontaine: Acta Cryst., B41 (1985), 281.
2. N. Tanaka and J. M. Cowley: Acta Cryst., A43 (1987), 337.
3. D. Shindo and M. Hirabayashi: Acta Cryst., A44 (1988), 954.
4. M. J. Hytch and J.-P. Chevalier: Ultramicroscopy, 52 (1993), 415.
5. P. De Meulenaere, D. Van Dyck, O, Van Tendeloo and J. Van Landuyt: Ultramicroscopy, 60 (1995), 171.
6. S. Hata, S. Matsumura, N. Kuwano and K. Oki: Acta Mater., 46 (1998), 881.
7. S. Hata, S. Matsumura, N. Kuwano and K. Oki: J. Surface Analysis, 3 (1997), 401.
8. J. E. Spruiell and E. E. Stansbury: J. Phys. Chem. Solids, 26 (1965), 811.
9. E. Ruedl, P. Delavignette and S. Amelinckx: Phys. Status Solidi, 28 (1968), 305.
10. U. D. Kulkarni and S. Banerjee: Acta Metall., 36 (1988), 413.
11. A. Taniyama, D. Shindo and T. Oikawa: J. Electron Microsc., 46 (1997), 303.