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Volumn 306, Issue 1-2, 1998, Pages 107-113

SiO2 passivation film effects on YBCO junctions

Author keywords

Annealing; Humidity test; Josephson junction; SiO2 passivation film; YBCO degradation

Indexed keywords

ANNEALING; PASSIVATION; SILICA; SUPERCONDUCTING FILMS; YTTRIUM BARIUM COPPER OXIDES;

EID: 0032157159     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(98)00356-6     Document Type: Article
Times cited : (5)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.