-
1
-
-
0003571345
-
-
[I] D. S. Ballantine, R. M. White, S. J. Martin, A. J. Ricco, E. T. Zellers, G. C. Frye, and H. Wohlljen, Acoustic Wn:ue Sensors, Theory, Design, and Physico-Chcrnical Applications. New York: Academic, 1997.
-
Acoustic Wn:ue Sensors, Theory, Design, and Physico-Chcrnical Applications. New York: Academic, 1997.
-
-
Ballantine, D.S.1
White, R.M.2
Martin, S.J.3
Ricco, A.J.4
Zellers, E.T.5
Frye, G.C.6
Wohlljen, H.7
-
2
-
-
84939355104
-
-
Survey of quartz bulk resonator sensor technologies
-
E. P. EerNisse, R. W. Ward, and R. B. Wiggins, Survey of quartz bulk resonator sensor technologies, IEEE Trans. Ultrason., Ferroelect., Freq. Cnntr., vol. 35, pp. 323-330, 1988.
-
IEEE Trans. Ultrason., Ferroelect., Freq. Cnntr., Vol. 35, Pp. 323-330, 1988.
-
-
Eernisse, E.P.1
Ward, R.W.2
Wiggins, R.B.3
-
3
-
-
84972811695
-
-
Analytical uses of piezoelectric crystals: A review
-
[3| G. G. Guilbault and J. M. Jordan, Analytical uses of piezoelectric crystals: A review, CRC Critical Rev. Analyt. Chem., vol. 19, no. 1, pp. 1-28, 198S.
-
CRC Critical Rev. Analyt. Chem., Vol. 19, No. 1, Pp. 1-28, 198S.
-
-
Guilbault, G.G.1
Jordan, J.M.2
-
6
-
-
84981621182
-
-
Static and dynamic frequency temperature behavior of singly and doubly rotated oven controlled ' quartz resonators, in
-
A. Ballato and J. R. Vig, Static and dynamic frequency temperature behavior of singly and doubly rotated oven controlled ' quartz resonators, in Proc. 32nd Annu. Symp. Preq. Contr., 1978, pp. 180-188.
-
Proc. 32nd Annu. Symp. Preq. Contr., 1978, Pp. 180-188.
-
-
Ballato, A.1
Vig, J.R.2
-
9
-
-
0017455901
-
-
Further experimental data on stress and thermal gradient compensated crystals
-
J. A. Küsters and J. G. Leach, Further experimental data on stress and thermal gradient compensated crystals, Proc. IEEE, pp. 282-284, 1977.
-
Proc. IEEE, Pp. 282-284, 1977.
-
-
Küsters, J.A.1
Leach, J.G.2
-
11
-
-
33747936512
-
-
S. Schodowski, U.S. Patent 4,872,765, Oct. 10, 1989
-
S. Schodowski, U.S. Patent 4,872,765, Oct. 10, 1989.
-
-
-
-
14
-
-
33747896788
-
-
J. Küsters, et ai, U.S. Pat. No. 4,079,280, 1978.
-
Et Ai, U.S. Pat. No. 4,079,280, 1978.
-
-
Küsters, J.1
-
15
-
-
0027663914
-
-
A dual-mode thickness-shear quartz pressure sensor
-
R. J. Besson, J. J. Boy, B. Glotin, Y. Jinzaki, B. Smha, and M. Valdois, A dual-mode thickness-shear quartz pressure sensor, EE Train,. UlLraaon,., Fe.rrodr.ct., Freq. Contr., vol. 40, pp. 584-591, 1993.
-
EE Train,. UlLraaon,., Fe.rrodr.ct., Freq. Contr., Vol. 40, Pp. 584-591, 1993.
-
-
Besson, R.J.1
Boy, J.J.2
Glotin, B.3
Jinzaki, Y.4
Smha, B.5
Valdois, M.6
-
16
-
-
0029301929
-
-
Frequency-output force sensor using a. multimode doubly rotated quartz resonator
-
B. Dulmet, R. Bourquin, and N. Shibanova, Frequency-output force sensor using a. multimode doubly rotated quartz resonator, Sens. Actuators A, vol. 48, pp. 109-116, 1995,
-
Sens. Actuators A, Vol. 48, Pp. 109-116, 1995
-
-
Dulmet, B.1
Bourquin, R.2
Shibanova, N.3
-
17
-
-
0030399030
-
-
H. Phillips, and B. E. Rose, The microcomputer compensated crystal oscillator-a progress report
-
E. Jackson. H. Phillips, and B. E. Rose, The microcomputer compensated crystal oscillator-a progress report, in IEEE Int. Freq. Contr. Symp., 1996, pp. 687-692.
-
IEEE Int. Freq. Contr. Symp., 1996, Pp. 687-692.
-
-
Jackson, E.1
-
18
-
-
33747998684
-
-
Method of measuring mass change using a quartz crystal microbalance, U.S. Patent Appl. S/N U8/545162, 1995
-
J. R. Vig and R. L. Filler, Method of measuring mass change using a quartz crystal microbalance, U.S. Patent Appl. S/N U8/545162, 1995.
-
-
-
Vig, J.R.1
Filler, R.L.2
-
19
-
-
0017219891
-
-
UV/Ozone Cleaning of Surfaces
-
J. R. Vig and J. W. LeBus, UV/Ozone Cleaning of Surfaces, IEEE Trans. Parts, Hybrids Packaging, vol. PHP-12, pp. 365370, 1976.
-
IEEE Trans. Parts, Hybrids Packaging, Vol. PHP-12, Pp. 365370, 1976.
-
-
Vig, J.R.1
Lebus, J.W.2
-
20
-
-
33748026466
-
-
Ultraviolet-ozone cleaning of semiconductor surfaces, in
-
J. R. Vig, Ultraviolet-ozone cleaning of semiconductor surfaces, in Handbook of Semiconductor Wafer Cleaning Technology, W. Korn, Ed. Noyes Publications, 1993, pp. 233-273.
-
Handbook of Semiconductor Wafer Cleaning Technology, W. Korn, Ed. Noyes Publications, 1993, Pp. 233-273.
-
-
Vig, J.R.1
-
22
-
-
0021477434
-
-
Improved quart, crystal rulcroliHlHnc technique
-
E. Benes. Improved quart, crystal rulcroliHlHnc technique, J. Appl. Phys., vol. 56, pp. 608-626, 1984.
-
J. Appl. Phys., Vol. 56, Pp. 608-626, 1984.
-
-
Benes, E.1
-
23
-
-
0026154354
-
-
E. Renés, W. Bi;rger, and V. Kravchenko, Motional capacitance of layered piezoelectric thickness-mode resonators
-
M. Schniid, E. Renés, W. Bi;rger, and V. Kravchenko, Motional capacitance of layered piezoelectric thickness-mode resonators, IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 38, pp. 199-206, 1991.
-
IEEE Trans. Ultrason., Ferroelect., Freq. Contr., Vol. 38, Pp. 199-206, 1991.
-
-
Schniid, M.1
-
25
-
-
33748011397
-
-
Subtle effects in high stability vibrators, in
-
A. Ballato, T. J. Lukaszek, and G. J. lafrate, Subtle effects in high stability vibrators, in Proc. 34th Annu. Freq. Contr. Symp., 1980, pp. 431-444.
-
Proc. 34th Annu. Freq. Contr. Symp., 1980, Pp. 431-444.
-
-
Ballato, A.1
Lukaszek, T.J.2
Lafrate, G.J.3
-
26
-
-
0031356222
-
-
J. R. Vig, J. C. Camparo, L. S. Cutler, L. Maleki, W. J. Riley. S. R. Stein, C. Thomas, F. L. Walls, and J. D. White, Draft revision of IEEE 3TD 1139-1988 standard definitions of physical quantities for fundamental frequency and time metrology-random instabilities,'1 in
-
E. S. Fcrre-Pikal, J. R. Vig, J. C. Camparo, L. S. Cutler, L. Maleki, W. J. Riley. S. R. Stein, C. Thomas, F. L. Walls, and J. D. White, Draft revision of IEEE 3TD 1139-1988 standard definitions of physical quantities for fundamental frequency and time metrology-random instabilities,'1 in Proc. Int. Freg. Contr. Sijmp., 1997, 338-357.
-
Proc. Int. Freg. Contr. Sijmp., 1997, 338-357.
-
-
Fcrre-Pikal, E.S.1
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