Microscopic examination of the microwave sintered (Pb0.6Sr0.4)TiO3 positive-temperature-coefficient resistor materials

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 37, Issue 9 PART B, 1998, Pages 5269-5272

  Chou, Chen Chia ^a   Chang, Hon Yi ^b   Lin, I Nan ^b   Shaw, Bin Jen ^c   Tan, Jian Tao ^c  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^c CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Electron diffraction; Electron microscope; Ferroelectric; Lead strontium titanate; Microwave sintering; Positive temperature coefficient resistor

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; ELECTRON DIFFRACTION; ENERGY DISPERSIVE SPECTROSCOPY; FERROELECTRIC MATERIALS; HIGH TEMPERATURE PROPERTIES; MICROSCOPIC EXAMINATION; MICROWAVES; RESISTORS; SCANNING ELECTRON MICROSCOPY; SINTERING; TRANSMISSION ELECTRON MICROSCOPY;

LEAD STRONTIUM TITANATE; POSITIVE TEMPERATURE COEFFICIENT RESISTOR;

SEMICONDUCTING LEAD COMPOUNDS;

EID: 0032154809     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.5269     Document Type: Article

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