High-speed measurements in optical low-coherence reflectometry

Measurement Science and Technology

Volumn 9, Issue 8, 1998, Pages 1159-1162

  Szydlo, J ^a   Bleuler, H ^a   Walti R ^a   Salathe R P ^a  

^a EPFL   (Switzerland)

Author keywords

Depth scanning; High speed scanning; Michelson interferometer; Optical low coherence reflectometry

Indexed keywords

GLASS; INTERFEROMETERS; SCANNING;

DEPTH OPTICAL SCANNING; MICHELSON INTERFEROMETERS; OPTICAL LOW COHERENCE REFLECTOMETRY;

REFLECTOMETERS;

EID: 0032142443     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/9/8/003     Document Type: Article

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