Measurement of surface roughness by atomic force microscopy and Rutherford backscattering spectrometry of CdS nanocrystalline films

Applied Surface Science

Volumn 133, Issue 4, 1998, Pages 293-297

  Nanda, K K ^a   Sarangi, S N ^a   Sahu, S N ^a  

^a INSTITUTE OF PHYSICS   (India)

Author keywords

Atomic force microscopy; CdS; Roughness; Rutherford backscattering spectrometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; NANOSTRUCTURED MATERIALS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING CADMIUM COMPOUNDS; SURFACE ROUGHNESS;

CADMIUM SULFIDE;

THIN FILMS;

EID: 0032140401     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00212-8     Document Type: Article

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