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Solid State Communications

Volumn 97, Issue 11, 1996, Pages 965-969

Scaling of surface roughness in evaporated calcium fluoride films

(3) Mbise, G W a,b Niklasson, G A a Granqvist, C G a

a UPPSALA UNIVERSITY (Sweden)

b UNIVERSITY OF DAR ES SALAAM (Tanzania)

Author keywords

A. surfaces and interfaces; A. thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMS; CALCIUM COMPOUNDS; EVAPORATION; KINETIC THEORY; SEMICONDUCTING GLASS; SILICON NITRIDE; SUBSTRATES; SURFACE ROUGHNESS;

ATOMIC FORCE MICROSCOPY MEASUREMENT; CALCIUM FLUORIDE FILMS; CALIBRATED QUARTZ CRYSTAL MICROBALANCE; KINETIC ROUGHENING; SCHWOEBEL BARRIERS;

THIN FILMS;

EID: 0030109321 PISSN: 00381098 EISSN: None Source Type: Journal
DOI: 10.1016/0038-1098(95)00749-0 Document Type: Article

Times cited : (22)

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