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Volumn 78, Issue 2, 1998, Pages 105-113
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Investigations of dislocation patterns within grains and near grain boundaries in copper by the electron channelling contrast technique in scanning electron microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
DEFORMATION;
DISLOCATIONS (CRYSTALS);
GRAIN BOUNDARIES;
POLYCRYSTALS;
SCANNING ELECTRON MICROSCOPY;
STRESS ANALYSIS;
ELECTRON CHANNELING CONTRAST TECHNIQUE;
MULTICRYSTALS;
PERSISTENT SLIP BANDS (PSB);
SCHMID FACTOR;
COPPER;
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EID: 0032136793
PISSN: 09500839
EISSN: 13623036
Source Type: Journal
DOI: 10.1080/095008398178084 Document Type: Article |
Times cited : (35)
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References (12)
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