Lattice parameter and microhardness investigations on CdTe1-xSex

Journal of Materials Science: Materials in Electronics

Volumn 9, Issue 4, 1998, Pages 295-300

  Schenk, M ^a   Silber, C ^b  

^a Inst Min ^*  (Germany)

^b CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AGE HARDENING; COMPOSITION EFFECTS; LATTICE CONSTANTS; MECHANICAL VARIABLES MEASUREMENT; MICROHARDNESS; PHASE COMPOSITION; SEMICONDUCTOR GROWTH; SURFACE STRUCTURE; ANISOTROPY; INDENTATION; NEGATIVE IONS; POSITIVE IONS; SOLID SOLUTIONS; VICKERS HARDNESS TESTING;

CADMIUM TELLURIUM SELENIDE; VICKERS INDENTATION MICROHARDNESS MEASUREMENT; MICROHARDNESS MEASUREMENTS; SOLID SOLUTION HARDENING;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0032131256     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008880823853     Document Type: Article

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