Validity of the lattice-parameter vegard-rule in Cdi1-xZnxTe solid solutions

Crystal Research and Technology

Volumn 31, Issue 5, 1996, Pages 665-672

  Schenk, M ^a   Hahnert I ^a   Duong, L T H ^a   Niebsch, H H ^a  

^a HUMBOLDT UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION; CRYSTALS; ELECTRON DIFFRACTION; LATTICE CONSTANTS; SOLID SOLUTIONS; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

BRIDGMAN METHOD; POWDER DIFFRACTION ANALYSIS; VEGARD RULE; WAVELENGTH DISPERSIVE X RAY SPECTROSCOPY; X RAY DIFFRACTOMETRY;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0029697615     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/crat.2170310524     Document Type: Article

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