X-ray study of residual stress distribution of ground ceramics

JSME International Journal, Series A: Mechanics and Material Engineering

Volumn 41, Issue 3, 1998, Pages 422-429

  Sakaida, Yoshihisa ^a   Tanaka, Keisuke ^b   Ikuhara, Yuichi ^c   Suzuki, Kenji ^d  

^a JAPAN FINE CERAMICS CENTER   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

^d NIIGATA UNIVERSITY   (Japan)

Author keywords

Ceramics; Dislocation; Glancing Incidence X ray Diffraction Method; Grinding; Residual Stress; Transmission Electron Microscopy; X ray Stress Measurement

Indexed keywords

DISLOCATIONS (CRYSTALS); RESIDUAL STRESSES; SILICON NITRIDE; STRAIN; STRESS ANALYSIS; X RAY DIFFRACTION;

STRESS DISTRIBUTION;

CERAMIC MATERIALS;

RESIDUAL STRESS;

EID: 0032128649     PISSN: 13408046     EISSN: None     Source Type: Journal    
DOI: 10.1299/jsmea.41.422     Document Type: Article

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