Penetration depth in X-ray analysis of steep stress gradient near surface

Zairyo/Journal of the Society of Materials Science, Japan

Volumn 45, Issue 7, 1996, Pages 759-765

  Suzuki, Kenji ^a   Tanaka, Keisuke ^b   Sakaida, Yoshihisa ^c  

^a NIIGATA UNIVERSITY   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

^c JAPAN FINE CERAMICS CENTER   (Japan)

Author keywords

Ceramics; Residual stress; Stress gradient; X ray penetration depth; X ray stress measurement

Indexed keywords

BENDING (DEFORMATION); CERAMIC MATERIALS; COMPUTER SIMULATION; MEASUREMENT ERRORS; NUMERICAL METHODS; RESIDUAL STRESSES; SILICON NITRIDE; STRESS CONCENTRATION; SURFACES; X RAY ANALYSIS;

APPLIED STRESS; PENETRATION DEPTH; STEEP STRESS GRADIENT; X RAY STRESS MEASUREMENT; X RAY TILT ANGLE;

STRESS ANALYSIS;

EID: 0030194301     PISSN: 05145163     EISSN: None     Source Type: Journal    
DOI: 10.2472/jsms.45.759     Document Type: Article

References (12)

1. B. Eigenman, B. Scholtes and E. Macherauch, Residual Stresses-III Science and Technology, 1, 601 (1992).
2. U. Wolfstieg, HTM, 31, 19 (1976).