Calculation of thin-film optical constants by transmittance-spectra fitting

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 15, Issue 7, 1998, Pages 1852-1857

  Nenkov, Milen ^a   Pencheva, Tamara ^a  

^a UNIVERSITY OF RUSE   (Bulgaria)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; LIGHT INTERFERENCE; MAGNETRON SPUTTERING; NUMERICAL METHODS; OPTICAL FILMS; OPTICAL VARIABLES MEASUREMENT; QUANTUM THEORY; REFRACTIVE INDEX; SPECTRUM ANALYSIS; THICKNESS MEASUREMENT; THIN FILMS; TITANIUM COMPOUNDS;

FILM INTERFERENCE TRANSMITTANCE SPECTRUM; FOROUHI MODEL DISPERSION EQUATIONS; NUMERICAL OPTIMIZATION METHODS; TRANSMITTANCE SPECTRA FITTING;

OPACITY;

EID: 0032123145     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.15.001852     Document Type: Article

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