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Volumn 14, Issue 3, 1997, Pages 686-692

Symmetrical five-layer periods from nonabsorbing high- and low-refractive-index materials

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EID: 0000226703     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.14.000686     Document Type: Article
Times cited : (13)

References (11)
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  • 5
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    • Equivalent layers: Another way to look at them
    • C. J. Van der Laan and H. J. Frankena, “Equivalent layers: another way to look at them,” Appl. Opt. 34, 681–687 (1995).
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  • 6
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    • Thin film reflection filters
    • H. Kostlin and G. Frank, “Thin film reflection filters,” Philips Tech. Rev. 41, 225–238 (1983/1984).
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    • Kostlin, H.1    Frank, G.2
  • 7
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    • Selective multilayer mirrors for white light based on ti and si oxides prepared by ion sputtering in vacuum
    • Nova, Science Publishers, New York
    • T. Pencheva and M. Nenkov, “Selective multilayer mirrors for white light based on Ti and Si oxides prepared by ion sputtering in vacuum” in Vacuum, Electron and Ion Technologies (Nova, Science Publishers, New York, 1995), pp. 156–163.
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  • 8
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  • 9
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    • Utilization of kards equation to suppress the high-frequency reflectance bands of periodic multilayers
    • P. Baumeister, “Utilization of Kard’s equation to suppress the high-frequency reflectance bands of periodic multilayers,” Appl. Opt. 24, 2687–2689 (1985).
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  • 10
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    • Simulation of a rugate filter via a steppedindex dielectric multilayer
    • P. Baumeister, “Simulation of a rugate filter via a steppedindex dielectric multilayer,” Appl. Opt. 25, 2644–2645 (1986).
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    • Baumeister, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.